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Structure and Dielectric Study of Poly(α,α difluoro‐p‐xylylene) Thin Films: Highlight of the Substrate Temperature Effect

Identifieur interne : 000400 ( Main/Exploration ); précédent : 000399; suivant : 000401

Structure and Dielectric Study of Poly(α,α difluoro‐p‐xylylene) Thin Films: Highlight of the Substrate Temperature Effect

Auteurs : Abdelkader Kahouli [France] ; Emmanuel André [France] ; Alain Sylvestre [France] ; Sébastien Pairis [France] ; Fathi Jomni [Tunisie] ; Béchir Yangui [Tunisie] ; Jean-Luc Garden [France]

Source :

RBID : ISTEX:D5C12AE6BED38F8E363CE0BC84FE28B3AC21B359

Abstract

Research on poly(α,α difluoro‐p‐xylylene) thin films is described and summarized. The important physicochemical and dielectric properties are investigated. For this, characterization tools that can provide information on the nature of structural and physicochemical according substrate temperature are used. A summary of the main properties of poly(α,α difluoro‐p‐xylylene) is presented.

Url:
DOI: 10.1002/cvde.201204310


Affiliations:


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